Power and Type I error rates of goodness-of-fit statistics for binomial generalized estimating equations (GEE) models

Computational Statistics and Data Analysis

Volumn 50, Issue 12, 2006, Pages 3432-3448

  Lin, Hui Yi ^a   Myers, Leann ^b  

^a LOUISIANA STATE UNIVERSITY SCHOOL OF MEDICINE   (United States)

^b TULANE UNIVERSITY   (United States)

Author keywords

Correlated binary data; GEE; Generalized estimating equations; Goodness of fit; Power; Type I error

Indexed keywords

BIT ERROR RATE; COMPUTATIONAL METHODS; COMPUTER SIMULATION; LOGIC PROGRAMMING; MATRIX ALGEBRA; REGRESSION ANALYSIS; STATISTICS;

CORRELATED BINARY DATA; GENERALIZED ESTIMATING EQUATIONS; GENERALIZED ESTIMATING EQUATIONS (GEE) MODELS; GOODNESS OF FIT; POWER; TYPE I ERROR;

NONLINEAR EQUATIONS;

EID: 33747070289     PISSN: 01679473     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.csda.2005.07.017     Document Type: Article

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