A comparison of goodness of fit tests for the logistic GEE model

Statistics in Medicine

Volumn 24, Issue 8, 2005, Pages 1245-1261

  Evans, Scott ^a   Li, Lingling ^a  

^a CENTER FOR BIOSTATISTICS IN AIDS RESEARCH   (United States)

Author keywords

Clustered binary data; GEE; Goodness of fit; Logistic regression; Power; Type I error

Indexed keywords

ANALYTICAL ERROR; ARTICLE; CLUSTER ANALYSIS; COVARIANCE; INTERMETHOD COMPARISON; LOGISTIC REGRESSION ANALYSIS; PROBABILITY; SIMULATION; STATISTICAL DISTRIBUTION; STATISTICAL MODEL; STATISTICS;

BIOMETRY; DATA INTERPRETATION, STATISTICAL; DIABETIC RETINOPATHY; HUMANS; LOGISTIC MODELS; MODELS, STATISTICAL; RISK FACTORS; WISCONSIN;

EID: 16844380315     PISSN: 02776715     EISSN: None     Source Type: Journal    
DOI: 10.1002/sim.2023     Document Type: Article

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