Goodness-of-fit tests for GEE modeling with binary responses

Biometrics

Volumn 54, Issue 2, 1998, Pages 720-729

  Barnhart, Huiman X ^a   Williamson, John M ^b  

^a EMORY UNIVERSITY   (United States)

^b CENTERS FOR DISEASE CONTROL AND PREVENTION   (United States)

Author keywords

Correlated data; GEE modeling; Goodness of fit test; Logistic regression; Score test

Indexed keywords

ANALYSIS OF DATA; BINARY RESPONSE; CORRELATED DATA; EQUATION MODELS; GENERALIZED ESTIMATING EQUATION MODELING; GENERALIZED ESTIMATING EQUATIONS; GOODNESS OF FIT; GOODNESS-OF-FIT TEST; LOGISTICS REGRESSIONS; SCORE TEST;

DEGREES OF FREEDOM (MECHANICS);

INSULIN;

ARTICLE; DATA ANALYSIS; DIABETIC RETINOPATHY; DISEASE SEVERITY; HUMAN; INSULIN TREATMENT; MAJOR CLINICAL STUDY; MATHEMATICAL ANALYSIS; REGRESSION ANALYSIS; SIMULATION; STATISTICAL ANALYSIS;

EID: 0031776087     PISSN: 0006341X     EISSN: None     Source Type: Journal    
DOI: 10.2307/3109778     Document Type: Article

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