Goodness-of-fit tests for GEE with correlated binary data

Scandinavian Journal of Statistics

Volumn 29, Issue 1, 2002, Pages 101-110

  Pan, Wei ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

Generalized estimating equations; Logistic regression; Pearson's chi square; Unweighted sum of squares

Indexed keywords

EID: 0036005421     PISSN: 03036898     EISSN: None     Source Type: Journal    
DOI: 10.1111/1467-9469.00091     Document Type: Article

References (16)

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