Microscopic polarization retention properties of ferroelectric Pb(Zr,Ti)O3 thin films

Ferroelectrics

Volumn 335, Issue , 2006, Pages 61-68

  Song, Tae Kwon ^a   Yoon, Jong Gul ^b   Kwun, Sook Il ^c  

^a Changwon National University   (South Korea)

^b Suwon University   (South Korea)

^c Seoul National University   (South Korea)

Author keywords

Domain stability; Electrostatic force microscope; Epitaxial PZT film; Polarization relaxation; Polarization retention

Indexed keywords

CRYSTAL GROWTH; EPITAXIAL GROWTH; LEAD COMPOUNDS; MICROSCOPIC EXAMINATION; POLARIZATION; POLYCRYSTALLINE MATERIALS;

DOMAIN STABILITY; ELECTROSTATIC FORCE MICROSCOPE; EPITAXIAL PZT FILMS; POLARIZATION RELAXATION; POLARIZATION RETENTION;

FERROELECTRIC THIN FILMS;

EID: 33746858512     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190600689332     Document Type: Conference Paper

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