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Volumn 14, Issue 10-11, 2006, Pages 1151-1156

Solid-state diffusion bonding of gamma-TiAl alloys using Ti/Al thin films as interlayers

Author keywords

A. Titanium aluminides, based on TiAl; B. Bonding; C. Joining; C. Thin films; F. Electron microscopy, scanning

Indexed keywords

CHEMICAL BONDS; COMPOSITION; DIFFUSION; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; TITANIUM ALLOYS;

EID: 33746738144     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.intermet.2005.12.011     Document Type: Article
Times cited : (84)

References (21)
  • 1
    • 0024701113 scopus 로고
    • Kim Y.-W. JOM 41 (1989) 24
    • (1989) JOM , vol.41 , pp. 24
    • Kim, Y.-W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.