Coupling of transient ultra wide band electromagnetic fields to complex electronic systems

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2005, Pages 483-488

  Camp, M ^a   Garbe, H ^a   Sabath, F ^b  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b Armed Forces Scientific Institute for Protection Technologies NBC Protection   (Germany)

Author keywords

Coupling; Electronic; EMP; Intereference; UWB

Indexed keywords

COUPLED CIRCUITS; ELECTROMAGNETIC FIELD EFFECTS; LARGE SCALE SYSTEMS; MICROCONTROLLERS; NETWORKS (CIRCUITS); PULSE CIRCUITS; SIGNAL INTERFERENCE;

COUPLING; ELECTRONIC; EMP; INTEREFERENCE; UWB;

BROADBAND NETWORKS;

EID: 33746625206     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.2005.1513563     Document Type: Conference Paper

References (10)

1. M.Camp, H.Garbe, parameter Estimation of Double Exponential Pulses (EMP, UWB) with Least Squares and Nelder Mead Algorithm", IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, VOL. 46, NO. 4, November 2004, pp. 675-678
2. C.Braun, "Aufbau eines breitbandigen Wellenleiters für NEMP Modell Simulationen", INT Report, Okt. 84
3. M.Camp, H.Garbe, D.Nitsch, "UWB and EMP Susceptibility of Modern Electronics", IEEE EMC, Montreal, August 13-17, 2001, ISBN: 0-7803-6569-0, pp. 1015-1020
4. M.Camp, H.Gerth, H.Garbe, H.Haase, "predicting the Breakdown Behavior of Microcontrollers under EMP/UWE Impact Using a Statistical Analysis", IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, VOL. 46, NO. 3, August 2004, pp. 369-379
5. Taylor, C.D.; Giri, D.V.: "High Power Microwave Systems and Effects", Taylor and Francis, 1994
6. Nelder, J.A. and R. Mead, "A Simplex Method for Function Minimization", Computer Journal, Vol. 7, p. 308-313.
7. Hübler, O.; Fischer, O.: "Ökonometrie", Gustav Fischer Verlag, Stuttgart New York, ISBN 3-437-40215-3
8. th European Symposium on Electromagnetic Compatibility, Belgien, Brügge 2000, sept.11-15, ISBN: 9-0760191-4-2, pp. 345-350
9. Nitsch, D.: "Einkopplung und Wirkung ultrabreitbandiger elektromagnetischer Impulse in komplexe elektronische Systeme", PhD Thesis, TU Hamburg Harburg, 2005
10. M.Camp, H.Garbe, D.Nitsch, "Influence of the Technology on the Destruction Effects of Semiconductors by Impact of EMP and UWB Pulses", 2002 IEEE International Symposium on Electromagnetic Compatibility, USA, Minneapolis 2002, August 19-23, ISBN: 0-7803-7265-6, pp. 87-92