Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysis

IEEE Transactions on Electromagnetic Compatibility

Volumn 46, Issue 3, 2004, Pages 368-379

  Camp, Michael ^a   Gerth, Hendrik ^a   Garbe, Heyno ^a   Haase, Helmut ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTROMAGNETIC PULSE; MATHEMATICAL MODELS; MICROCONTROLLERS; STATISTICAL METHODS; WEIBULL DISTRIBUTION;

BREAKDOWN FAILURE PROBABILITY; BREAKDOWN FAILURE RATE; DESTRUCTION FAILURE PROBABILITY; DESTRUCTION FAILURE RATE; ELECTRIC FIELD AMPLITUDES; ELECTROMAGNETIC FIELD THREAT; INTENTIONAL ELECTROMAGNETIC INTERFERENCE; ULTRAWIDEBAND;

ELECTROMAGNETIC WAVE INTERFERENCE;

EID: 4444275609     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2004.831816     Document Type: Article

References (11)

1. C. Braun, W. Graf, P. Guidi, and H. Schmidt, "HPM Störfestigkeitsuntersuchungen an modernen Hochleistungsprozessorplatinen," in Bundesakademie für Wehrverwaltung und Wehrtechnik, Mannheim, Symp.-Band EMV-Symp., Mannheim, Germany, 1999, pp. 24.1-24.8.
2. H. Büning and G. Trenkler, Nichtparametrische statistische Methoden, 2 ed. Berlin, Germany: de Gruyter, 1994.
3. M. Camp, H. Garbe, and D. Nitsch, UWB and EMP Susceptibility of Modern Electronics. Montreal, QC, Canada, Aug. 13-17, 2001, pp. 1015-1020.
4. H. Frohne and E. Ueckert, Grundlagen der elektrischen Messtechnik. Stuttgart, Germany: Teubner Verlag, 1984.
5. H. Garbe and M. Camp, "Susceptibility of different semiconductor technologies to EMP and UWB," in Proc. XXVIIth General Assembly Int. Union of Radio Science (URSI) 2002, Maastricht, The Netherlands, Aug. 17-24, 2002.
6. O. Hübler, Ökonometrie. Stuttgart, Germany: Gustav Fischer Verlag, 1989.
7. Electromagnetic Compatibility (EMC) - Part 4-20: Testing and Measurement Techniques, Emission and Immunity Testing in Transverse Electromagnetic (TEM) Waveguides, IEC, Geneva, Switzerland, 2001.
8. A. Namenson and T. J. Wieting, "Generic response to high power microwaves," in European Electromagnetics Int. Symp. Electromagnetic Environments and Consequences., vol. 1, 1994, pp. 312-319.
9. D. Nitsch and M. Camp, "UWB and EMP Susceptibility of Modern Microprocessor boards," in Proc. EMC Europe, Brugge, The Netherlands, Sept. 2000, pp. 345-350.
10. C. D. Taylor and D. V. Giri, High Power Microwave Systems and Effects. New York: Taylor & Francis, 1994.
11. W. Uhlmann, Statistische Qualitätskontrolle. Stuttgart, Germany: Teubner, 1982.