SCOPUS 정보 검색 플랫폼

Volumn 89, Issue 4, 2006, Pages

Characteristics of sputtered Hf 1-xSi xO 2/Si/GaAs gate stacks

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE-VOLTAGE (CV) MEASUREMENTS; FREQUENCY DISPERSION; GAAS GATE STACKS; PHOTOLUMINESCENCE INTENSITY;

CAPACITANCE; CMOS INTEGRATED CIRCUITS; DIELECTRIC DEVICES; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SILICON COMPOUNDS; STACKING FAULTS;

HAFNIUM COMPOUNDS;

EID: 33746594936 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2234304 Document Type: Conference Paper

Times cited : (26)

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