Kelvin probe microscopy to image and characterise erasable electrostatic lithography

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 34, Issue 1-2, 2006, Pages 686-688

  Crook, Rolf ^a   Smith, Charles G ^a   Chorley, Simon ^a   Farrer, Ian ^a   Beere, Harvey E ^a   Ritchie, David A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

EEL; Erasable electrostatic lithography; GaAs surface states; Kelvin probe microscopy; KPM; Scanning probe

Indexed keywords

ELECTRIC CHARGE; ELECTRONS; ELECTROSTATICS; LITHOGRAPHY; QUANTUM THEORY; SEMICONDUCTING GALLIUM ARSENIDE; THERMAL EFFECTS;

EEL; ERASABLE ELECTROSTATIC LITHOGRAPHY; GAAS SURFACE STATES; KELVIN PROBE MICROSCOPY; KPM; SCANNING PROBE;

IMAGE ANALYSIS;

EID: 33746448687     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2006.03.061     Document Type: Article

References (14)

1. Schönenberger C., and Alvarado S.F. Phys. Rev. Lett. 65 (1990) 3162
2. McCormick K.L., et al. Phys. Rev. B 59 (1999) 4654
3. Gil A., et al. Nanotechnology 14 (2003) 332
4. Vancura T., et al. Appl. Phys. Lett. 83 (2003) 2602
5. Crook R., et al. Nature 242 (2003) 751
6. Crook R., et al. Physica E 22 (2004) 717
7. Tessmer S.H., Glicofridis P.I., Ashoori R.C., Levitov L.S., and Melloch M.R. Nature 392 (1998) 51-54
8. Terris B.D., Barrett R.C., and Mamin H.J. SPIE 1855 Scanning Probe Microscopies II (1993) 195
9. Jacobs H.O., and Whitesides G.M. Science 291 (2001) 1763
10. Crook R., et al. Phys. Rev. Lett. 91 (2003) 246803
11. Tortonese M., Barret R.C., and Quate C.F. Appl. Phys. Lett. 62 (1993) 834
12. Veeco Instruments www.veeco.com (formerly Thermomicroscopes and Park Scientific Instruments).
13. Zangwill A. Physics at Surfaces (1992), Cambridge University Press, Cambridge
14. Yoo M.J., et al. Science 276 (1997) 579