Exchange biasing and electric polarization with YMnO3

Applied Physics Letters

Volumn 89, Issue 3, 2006, Pages

  Marti X ^a,f   Sanchez F ^a   Hrabovsky, D ^a   Fabrega L ^a   Ruyter, A ^a   Fontcuberta, J ^a   Laukhin, V ^b   Skumryev, V ^c   Garcia Cuenca M V ^d   Ferrater, C ^d   Varela, M ^d   Vila A ^d   Luders U ^e   Bobo, J F ^e  

^a INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^b INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANÇATS ICREA   (Spain)

^c UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^d UNIVERSITY OF BARCELONA   (Spain)

^e CNRS   (France)

^f UNIVERSITÉ DE TOURS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; EPITAXIAL GROWTH; LAYERED MANUFACTURING; LIGHT POLARIZATION; LOW TEMPERATURE EFFECTS; POLARIZATION; SUBSTRATES; THIN FILMS;

BIFERROIC CHARACTER; ELECTRIC POLARIZATION; ELECTRICAL POLARIZATION;

YTTRIUM;

EID: 33746321828     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2234285     Document Type: Article

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