Room temperature bonding of silicon and lithium niobate

Applied Physics Letters

Volumn 89, Issue 3, 2006, Pages

  Howlader, M M R ^a,c   Suga, T ^a   Kim, M J ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b The University of Texas at Dallas   (United States)

^c MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACIAL LAYERS; PULLING ANGLES; ROOM TEMPERATURE; VISUAL INSPECTION;

AMORPHOUS SILICON; BINDING ENERGY; CHEMICAL BONDS; ELECTRON ENERGY LOSS SPECTROSCOPY; NANOSTRUCTURED MATERIALS; SILICON WAFERS;

LITHIUM COMPOUNDS;

EID: 33746317776     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2229262     Document Type: Article

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