Investigation of HgTe-HgCdTe superlattices by high-resolution x-ray diffraction

Journal of Electronic Materials

Volumn 35, Issue 6, 2006, Pages 1481-1486

  Hatch, S D ^a   Sewell, R H ^a   Dell, J M ^a   Faraone, L ^a   Becker, C R ^b   Usher, B ^c  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^b UNIVERSITY OF WÜRZBURG   (Germany)

^c LA TROBE UNIVERSITY   (Australia)

Author keywords

HgTe HgCdTe superlattices; Molecular beam epitaxy; Reciprocal space mapping; Uniformity; X ray diffraction

Indexed keywords

CADMIUM; MERCURY (METAL); MOLECULAR BEAM EPITAXY; SUBSTRATES; SUPERLATTICES; TELLURIUM; X RAY DIFFRACTION;

HGTE-HGCDTE SUPERLATTICES; RECIPROCAL SPACE MAPPING; SUPER-LATTICE LAYER; UNIFORMITY;

INTERMETALLICS;

EID: 33746191898     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-006-0288-5     Document Type: Conference Paper

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