In situ X-ray analysis under controlled potential conditions: An innovative setup and its application to the investigation of ultrathin films electrodeposited on Ag(1 1 1)

Electrochimica Acta

Volumn 51, Issue 25, 2006, Pages 5532-5539

  Foresti, Maria Luisa ^a   Pozzi, Andrea ^a   Innocenti, Massimo ^a   Pezzatini, Giovanni ^a   Loglio, Francesca ^a   Salvietti, Emanuele ^a   Giusti, Anna ^a   D'Anca, Fabio ^b   Felici, Roberto ^b   Borgatti, Francesco ^b  

^a UNIVERSITY OF FLORENCE   (Italy)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

ECALE; Electrochemical cell; In situ analysis; Surface X ray diffraction; X ray reflectometry

Indexed keywords

CADMIUM SULFIDE; CRYSTALS; DETECTORS; ELECTROCHEMISTRY; ELECTRODEPOSITION; SILVER; X RAY DIFFRACTION ANALYSIS;

ELECTROCHEMICAL ATOMIC LAYER EPITAXY (ECALE); ELECTROCHEMICAL CELL; IN SITU ANALYSIS; SURFACE X-RAY DIFFRACTION; X-RAY REFLECTOMETRY;

ULTRATHIN FILMS;

EID: 33746191790     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2006.02.031     Document Type: Article

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