X-ray photoelectron diffraction (XPD) study of the atomic structure of the ultrathin CdS phase deposited on Ag(111) by electrochemical atomic layer epitaxy (ECALE)

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 563-568

  Cecconi, Tiziana ^a   Atrei, Andrea ^b   Bardi, Ugo ^a   Forni, Francesca ^a   Innocenti, Massimo ^a   Loglio, Francesca ^a   Foresti, Maria Luisa ^a   Rovida, Gianfranco ^a  

^a UNIVERSITY OF FLORENCE   (Italy)

^b UNIVERSITY OF SIENA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM SULFIDE; CRYSTAL LATTICES; CRYSTAL ORIENTATION; ELECTROCHEMISTRY; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; SEMICONDUCTING CADMIUM COMPOUNDS; SILVER; SINGLE CRYSTALS; STOICHIOMETRY; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROCHEMICAL ATOMIC LAYER EPITAXY (ECALE); X RAY PHOTOELECTRON DIFFRACTION (XPD);

SEMICONDUCTING FILMS;

EID: 0035277787     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00239-5     Document Type: Article

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