Relationship between appearance crystalline planes and growth temperatures during sublimation growth of AlN crystals

Journal of Crystal Growth

Volumn 293, Issue 1, 2006, Pages 93-96

  Li, Juan ^a   Hu, Xiaobo ^a   Jiang, Shouzhen ^a   Ning, Lina ^a   Wang, Yingmin ^a   Chen, Xiufang ^a   Xu, Xiangang ^a   Wang, Jiyang ^a   Jiang, Minhua ^a  

^a SHANDONG UNIVERSITY   (China)

Author keywords

A1. Crystal morphology; B1. Aluminum nitride; B1. Nitrides

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; SUBLIMATION; X RAY DIFFRACTION ANALYSIS;

CRYSTAL MORPHOLOGY; CRYSTALLINE PLANES; GROWTH TEMPERATURE; SELF-SEEDED GROWTH;

ALUMINUM NITRIDE;

EID: 33746127330     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.04.110     Document Type: Article

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