Electron holography for improved measurement of microfields in nanoelectrode assemblies

Applied Physics Letters

Volumn 89, Issue 2, 2006, Pages

  Chou, Li Jen ^a   Chang, Mu Tung ^a   Chueh, Yu Lun ^a   Kim, Joong Jung ^b   Park, Hyun Soon ^b   Shindo, Daisuke ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRODES; MAGNETIC FIELDS; NANOSTRUCTURED MATERIALS; PROBLEM SOLVING; SINGLE CRYSTALS; TUNGSTEN;

EMISSION PROPERTY; NANODEVICES;

ELECTRON HOLOGRAPHY;

EID: 33746064479     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2221748     Document Type: Article

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