SCOPUS 정보 검색 플랫폼

Volumn 89, Issue 2, 2006, Pages

Impedance of nanometer sized silicon structures

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRIC CONDUCTANCE; NANOSTRUCTURED MATERIALS; SILICA;

CONSTANT CONDUCTANCE; INDUCTIVE BEHAVIOR; NANOCRYSTALLINE SILICON; SILICON OXIDE FILMS;

AMORPHOUS FILMS;

EID: 33746054940 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2221397 Document Type: Article

Times cited : (4)

References (8)

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- Fauchet, P.M.¹ Ruan, J.² Chen, H.³ Pavesi, L.⁴ Dal Negro, L.⁵ Cazzanelli, M.⁶ Elliman, R.G.⁷ Smith, N.⁸ Samoc, M.⁹ Luther-Davies, B.¹⁰

2
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- R. Martins, A. Macarico, I. Ferreira, R. Nunes, A. Bicho, and E. Fortunate, Thin Solid Films 303, 47 (1997).
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- Martins, R.¹ Macarico, A.² Ferreira, I.³ Nunes, R.⁴ Bicho, A.⁵ Fortunate, E.⁶

3
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- Meirav, U.¹ Kastener, M.² Wind, S.J.³

4
- 2942696234
- R. A. Rao, R. F. Steimle, M. Sadd, C. T. Swift, B. Hradsky, S. Straub, T. Merchant, M. Stoker, S. G. H. Anderson, M. Rossow, J. Yater, B. Acred, K. Harber, E. J. Prinz, B. E. White, Jr., and R. Muralidhar, Solid-State Electron. 48, 1463 (2004).
- (2004) Solid-state Electron. , vol.48 , pp. 1463
- Rao, R.A.¹ Steimle, R.F.² Sadd, M.³ Swift, C.T.⁴ Hradsky, B.⁵ Straub, S.⁶ Merchant, T.⁷ Stoker, M.⁸ Anderson, S.G.H.⁹ Rossow, M.¹⁰ Yater, J.¹¹ Acred, B.¹² Harber, K.¹³ Prinz, E.J.¹⁴ White Jr., B.E.¹⁵ Muralidhar, R.¹⁶

5
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- M. Burchielli, G. Conte, G. Fameli, C. Felici, M. C. Rossi, A. Rubino, S. Salvatori, and F. Villani, Mater. Sci. Eng., C C19, 175 (2002).
- (2002) Mater. Sci. Eng., C , vol.C19 , pp. 175
- Burchielli, M.¹ Conte, G.² Fameli, G.³ Felici, C.⁴ Rossi, M.C.⁵ Rubino, A.⁶ Salvatori, S.⁷ Villani, F.⁸

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- M. C. Rossi, S. Salvatori, M. Burchielli, and G. Conte, Thin Solid Films 383, 267 (2001).
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7
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- M. C. Rossi, S. Salvatori, F. Galluzzi, and G. Conte, Mater. Sci. Eng., B B69-70, 299 (2000).
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8
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- J. R. Macdonald, Impedance Spectroscopy: Emphasizing Solid Materials and Systems (Wiley, New York, 1987).
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- Macdonald, J.R.¹

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