An evaluation of the accuracy and precision of X-ray microanalysis techniques using BCR-126A glass reference material

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 897-902

  Gomez Morilla, Inmaculada ^a   Simon, Alíz ^b   Simon, Rolf ^c   Williams, C Terry ^d   Kiss, Árpád Z ^b   Grime, Geoffrey W ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^c KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^d DEPARTMENT OF LIFE SCIENCES   (United Kingdom)

Author keywords

Certified glass reference material; PIXE; Quantitative analysis; Synchrotron radiation XRF; WDS; X ray microanalysis

Indexed keywords

CHEMICAL ANALYSIS; MICROANALYSIS; SYNCHROTRON RADIATION; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY ANALYSIS;

CERTIFIED GLASS REFERENCE MATERIAL; PIXE; SYNCHROTRON RADIATION XRF;

GLASS;

EID: 33745964896     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.159     Document Type: Article

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