Quantitative analysis of major elements in silicate minerals and glasses by micro-PIXE

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 130, Issue 1-4, 1997, Pages 608-616

  Campbell, John L ^a   Czamanske, Gerald K ^b   MacDonald, Leonard ^a   Teesdale, William J ^a  

^a UNIVERSITY OF GUELPH   (Canada)

^b U S GEOLOGICAL SURVEY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTAL LATTICES; ELECTROMAGNETIC WAVE EMISSION; GLASS; MAGNESIUM; MICROANALYSIS; POTASSIUM; PROTONS; SILICATE MINERALS; SILICON; SODIUM; TRACE ELEMENTS;

ELECTRON MICROPROBES; NORMALIZATION FACTORS; PROTON INDUCED X RAY EMISSION (PIXE) ANALYSIS;

X RAY ANALYSIS;

EID: 0031548973     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00258-9     Document Type: Article

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