Quantitative trace element analyses of silicate reference materials and a stainless steel using the proton microprobe

Chemical Geology

Volumn 160, Issue 3, 1999, Pages 241-250

  Kurosawa, M ^a   Campbell, J L ^b   Teesdale, W J ^b   Ohyi, H ^c   Deguchi, Y ^a   Murao, S ^d  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b UNIVERSITY OF GUELPH   (Canada)

^c 2 1 30 Nishiki   (Japan)

^d Mineral and Fuel Rsrc Department   (Japan)

Author keywords

Glass; Microprobe; PIXE; Reference material; Trace element

Indexed keywords

ION MICROPROBE; REFERENCE SAMPLE; TRACE ELEMENT;

EID: 0033543063     PISSN: 00092541     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2541(99)00046-7     Document Type: Article

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