High lateral resolution 2D mapping of the B/C ratio in a boron carbide film formed by femtosecond pulsed laser deposition

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 454-457

  Simon, A ^a   Csako T ^b   Jeynes, C ^c   Szorenyi T ^b  

^a INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^b UNIVERSITY OF SZEGED   (Hungary)

^c UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Boron carbide; Chemical composition; Microbeam; Pulsed laser deposition; Rutherford backscattering spectrometry; Thickness profile

Indexed keywords

BORON CARBIDE; COMPOSITION; MAPPING; OPTICAL RESOLVING POWER; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

ELEMENTAL COMPOSITION; MICROBEAMS; THICKNESS PROFILE;

THIN FILMS;

EID: 33745962652     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.030     Document Type: Article

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