Localization of electrical-insulation-and partial-discharge failures of IGBT modules

IEEE Transactions on Industry Applications

Volumn 38, Issue 1, 2002, Pages 175-180

  Mitic, Gerhard ^a   Lefranc, Guy ^a  

^a SIEMENS AG   (Germany)

Author keywords

Electrical insulation; Insulated gate bipolar transistor module; Phase resolved partial discharge

Indexed keywords

ELECTRIC INSULATION; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; INTERFACES (MATERIALS); METALLIZING; PARTIAL DISCHARGES; SILICONES; SPECTROSCOPIC ANALYSIS;

PHASE-RESOLVED PARTIAL DISCHARGE;

INSULATED GATE BIPOLAR TRANSISTORS;

EID: 0036245360     PISSN: 00939994     EISSN: None     Source Type: Journal    
DOI: 10.1109/28.980373     Document Type: Conference Paper

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9. Corona discharge and aging process of an insulation
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14. The dynamic measurement of surface charge distribution deposited from partial discharge in air by pockels effect technique