Remanence due to wall magnetization and counterintuitive magnetometry data in 200-nm films of Ni

Physical Review Letters

Volumn 97, Issue 2, 2006, Pages

  Marioni, M A ^a   Pilet, N ^b   Ashworth, T V ^b   O'Handley, R C ^c   Hug, H J ^a,b  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b UNIVERSITY OF BASEL   (Switzerland)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; EPITAXIAL GROWTH; MAGNETIC ANISOTROPY; MAGNETIZATION; MICROSCOPIC EXAMINATION; NICKEL;

BLOCH DOMAIN WALLS; MAGNETIC FORCE MICROSCOPY; NI FILMS; WALL MAGNETIZATION;

MAGNETIC THICK FILMS;

EID: 33745900781     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.97.027201     Document Type: Article

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