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Journal of Microscopy

Volumn 223, Issue 1, 2006, Pages 53-56

Hard X-ray microscopy with Zernike phase contrast

(2) Hwa, Shik Youn a Jung, Suk Won a,b

a Pohang University of Science and Technology (POSTECH) (South Korea)

b Korea Electronic Technology Institute (KETI) (South Korea)

Author keywords

Phase contrast; X ray microscope; Zone plate

Indexed keywords

CESIUM IODIDE; IMAGE RESOLUTION; PLATES (STRUCTURAL COMPONENTS);

FRESNEL ZONE PLATE; HALO EFFECT; HARD X RAY; MICROSCOPE OBJECTIVE; PHASE-CONTRAST; SCINTILLATION CRYSTALS; SPATIAL RESOLUTION; X RAY MICROSCOPY; ZERNIKE PHASE CONTRAST; ZONE PLATES;

X RAY MICROSCOPES;

ARTICLE; CONTRAST ENHANCEMENT; IMAGING SYSTEM; OPTICAL RESOLUTION; PHASE CONTRAST MICROSCOPE; PHASE CONTRAST MICROSCOPY; PRIORITY JOURNAL; X RAY MICROANALYSIS; ZERNIKE PHASE CONTRAST;

EID: 33745852235 PISSN: 00222720 EISSN: 13652818 Source Type: Journal
DOI: 10.1111/j.1365-2818.2006.01592.x Document Type: Article

Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.