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Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 253-256
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Exploiting the third dimension in nanofabrication technology with scanned high energy ion beams
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Author keywords
Conducting nanostructures; Magnetic nanostructures; Nanotechnology; Nuclear nanoprobe; Proton transmission microscopy; Single ion tracks
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Indexed keywords
DATA STORAGE EQUIPMENT;
DEFECTS;
HEAVY IONS;
ION BEAMS;
IRRADIATION;
PROBABILITY DENSITY FUNCTION;
PROTONS;
SCANNING ELECTRON MICROSCOPY;
WAVE TRANSMISSION;
CONDUCTING NANOSTRUCTURES;
MAGNETIC NANOSTRUCTURES;
NUCLEAR NANOPROBES;
PROTON TRANSMISSION MICROSCOPY;
SINGLE ION TRACKS;
NANOTECHNOLOGY;
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EID: 33745848128
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2006.04.009 Document Type: Article |
Times cited : (4)
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References (17)
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