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Volumn 210, Issue , 2003, Pages 21-26
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The Amsterdam quintuplet nuclear microprobe
a
NIKHEF
(Netherlands)
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Author keywords
Grid shadow measurement; Ion beam facility; Nuclear microprobe
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Indexed keywords
ABERRATIONS;
FOCUSING;
MICROANALYSIS;
NUCLEAR INSTRUMENTATION;
OPTICAL INSTRUMENT LENSES;
PARTICLE OPTICS;
MICROPROBES;
ION BEAMS;
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EID: 0041474562
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(03)01006-1 Document Type: Conference Paper |
Times cited : (8)
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References (7)
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