Analysis of mode quality factors and mode reflectivities for nanowire cavity by FDTD technique

IEEE Journal of Quantum Electronics

Volumn 42, Issue 2, 2006, Pages 146-151

  Wang, Miao Qing ^a,b   Huang, Yong Zhen ^a,c   Chen, Qin ^a   Cai, Zhi Ping ^b  

^a INSTITUTE OF SEMICONDUCTORS   (China)

^b XIAMEN UNIVERSITY   (China)

^c HUAQIAO UNIVERSITY   (China)

Author keywords

Cavity resonators; FDTD methods; Laser modes; Nanowire cavity; Quality factor; Reflection coefficient

Indexed keywords

FDTD METHOD; FDTD METHODS; NANOWIRE CAVITIES; QUALITY FACTOR; REFLECTION COEFFICIENTS;

BANDPASS FILTERS; CAVITY RESONATORS; LASER MODES; MICROWAVE DEVICES; NANOWIRES; Q FACTOR MEASUREMENT; REFLECTION; REFRACTIVE INDEX;

FINITE DIFFERENCE TIME DOMAIN METHOD;

EID: 33745751843     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2005.861823     Document Type: Article

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