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Volumn 50, Issue 6, 2006, Pages 1041-1045

Schottky barrier height in GaN/AlGaN heterostructures

Author keywords

GaN HEMT; Modeling; Numerical simulation; Schottky barrier height

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; GALLIUM NITRIDE; PARAMETER ESTIMATION; POLARIZATION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 33745743720     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2006.04.011     Document Type: Article
Times cited : (21)

References (11)
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  • 2
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    • AlGaN/GaN HEMTs on SiC with over 100 GHz fT and low microwave noise
    • Lu W., Yang J., Khan M.A., and Adesida I. AlGaN/GaN HEMTs on SiC with over 100 GHz fT and low microwave noise. IEEE Trans Electron Dev 48 (2001) 581-585
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  • 5
    • 0001142431 scopus 로고    scopus 로고
    • Ni and Ti schottky barriers on n-AlGaN grown on SiC substrates
    • Yu L.S., Qiao D.J., Xing Q.J., and Lau S.S. Ni and Ti schottky barriers on n-AlGaN grown on SiC substrates. Appl Phys Lett 73 (1998) 238-240
    • (1998) Appl Phys Lett , vol.73 , pp. 238-240
    • Yu, L.S.1    Qiao, D.J.2    Xing, Q.J.3    Lau, S.S.4
  • 6
    • 0000722194 scopus 로고    scopus 로고
    • Dependence of Ni/AlGaN Schottky barrier height on Al mole fraction
    • Qiao D., Yu L.S., and Lau S.S. Dependence of Ni/AlGaN Schottky barrier height on Al mole fraction. J Appl Phys 87 (2000) 801-804
    • (2000) J Appl Phys , vol.87 , pp. 801-804
    • Qiao, D.1    Yu, L.S.2    Lau, S.S.3
  • 7
    • 0001590229 scopus 로고    scopus 로고
    • Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures
    • Ambacher O., et al. Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures. J Appl Phys 85 (1999) 3222-3233
    • (1999) J Appl Phys , vol.85 , pp. 3222-3233
    • Ambacher, O.1
  • 8
    • 18744364512 scopus 로고    scopus 로고
    • Photoionization spectroscopy in AlGaN/GaN high electron mobility transistors
    • Klein P.B. Photoionization spectroscopy in AlGaN/GaN high electron mobility transistors. J Appl Phys 92 (2002) 5498-5502
    • (2002) J Appl Phys , vol.92 , pp. 5498-5502
    • Klein, P.B.1
  • 9
    • 33745738744 scopus 로고    scopus 로고
    • ISE, Example Library, ISE TCAD Release 10.0 Manuals; 2004.
  • 10
    • 0035278801 scopus 로고    scopus 로고
    • Influence of electron mobility modeling on DC I-V characteristics of WZ-GaN MESFET
    • Polyakov V.M., and Schwierz F. Influence of electron mobility modeling on DC I-V characteristics of WZ-GaN MESFET. IEEE Trans Electron Dev 48 (2001) 512-516
    • (2001) IEEE Trans Electron Dev , vol.48 , pp. 512-516
    • Polyakov, V.M.1    Schwierz, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.