-
1
-
-
33745746259
-
-
Eastman LF, Experimental power-frequency limits of AlGaN/GaN HEMTs, In: Presented at IEEE MTT; 2002.
-
-
-
-
2
-
-
0035280079
-
AlGaN/GaN HEMTs on SiC with over 100 GHz fT and low microwave noise
-
Lu W., Yang J., Khan M.A., and Adesida I. AlGaN/GaN HEMTs on SiC with over 100 GHz fT and low microwave noise. IEEE Trans Electron Dev 48 (2001) 581-585
-
(2001)
IEEE Trans Electron Dev
, vol.48
, pp. 581-585
-
-
Lu, W.1
Yang, J.2
Khan, M.A.3
Adesida, I.4
-
3
-
-
1642359162
-
30-W/mm GaN HEMTs by field plate optimization
-
Wu Y.-F., Saxler A., Moore M., SMith R.P., Sheppard S., Chavarkar P.M., et al. 30-W/mm GaN HEMTs by field plate optimization. IEEE Electron Dev Lett 25 (2004) 117-119
-
(2004)
IEEE Electron Dev Lett
, vol.25
, pp. 117-119
-
-
Wu, Y.-F.1
Saxler, A.2
Moore, M.3
SMith, R.P.4
Sheppard, S.5
Chavarkar, P.M.6
-
4
-
-
0032306441
-
Evaluation of AlGaN/GaN HFET's up to 750 °C
-
Daumiller I., Kirchner C., Kamp M., Ebeling K., Pond L., Weitzel C.E., et al. Evaluation of AlGaN/GaN HFET's up to 750 °C. Device Res Conf Dig (1998) 114-115
-
(1998)
Device Res Conf Dig
, pp. 114-115
-
-
Daumiller, I.1
Kirchner, C.2
Kamp, M.3
Ebeling, K.4
Pond, L.5
Weitzel, C.E.6
-
5
-
-
0001142431
-
Ni and Ti schottky barriers on n-AlGaN grown on SiC substrates
-
Yu L.S., Qiao D.J., Xing Q.J., and Lau S.S. Ni and Ti schottky barriers on n-AlGaN grown on SiC substrates. Appl Phys Lett 73 (1998) 238-240
-
(1998)
Appl Phys Lett
, vol.73
, pp. 238-240
-
-
Yu, L.S.1
Qiao, D.J.2
Xing, Q.J.3
Lau, S.S.4
-
6
-
-
0000722194
-
Dependence of Ni/AlGaN Schottky barrier height on Al mole fraction
-
Qiao D., Yu L.S., and Lau S.S. Dependence of Ni/AlGaN Schottky barrier height on Al mole fraction. J Appl Phys 87 (2000) 801-804
-
(2000)
J Appl Phys
, vol.87
, pp. 801-804
-
-
Qiao, D.1
Yu, L.S.2
Lau, S.S.3
-
7
-
-
0001590229
-
Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures
-
Ambacher O., et al. Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures. J Appl Phys 85 (1999) 3222-3233
-
(1999)
J Appl Phys
, vol.85
, pp. 3222-3233
-
-
Ambacher, O.1
-
8
-
-
18744364512
-
Photoionization spectroscopy in AlGaN/GaN high electron mobility transistors
-
Klein P.B. Photoionization spectroscopy in AlGaN/GaN high electron mobility transistors. J Appl Phys 92 (2002) 5498-5502
-
(2002)
J Appl Phys
, vol.92
, pp. 5498-5502
-
-
Klein, P.B.1
-
9
-
-
33745738744
-
-
ISE, Example Library, ISE TCAD Release 10.0 Manuals; 2004.
-
-
-
-
10
-
-
0035278801
-
Influence of electron mobility modeling on DC I-V characteristics of WZ-GaN MESFET
-
Polyakov V.M., and Schwierz F. Influence of electron mobility modeling on DC I-V characteristics of WZ-GaN MESFET. IEEE Trans Electron Dev 48 (2001) 512-516
-
(2001)
IEEE Trans Electron Dev
, vol.48
, pp. 512-516
-
-
Polyakov, V.M.1
Schwierz, F.2
-
11
-
-
5444249923
-
Surface-related drain current dispersion effects in AlGaN-GaN HEMTs
-
Meneghesso G., Verzellesi G., Pierobon R., Rampazzo F., Chini A., Mishra U.K., et al. Surface-related drain current dispersion effects in AlGaN-GaN HEMTs. IEEE Trans Electron Dev 51 (2004) 1554-1561
-
(2004)
IEEE Trans Electron Dev
, vol.51
, pp. 1554-1561
-
-
Meneghesso, G.1
Verzellesi, G.2
Pierobon, R.3
Rampazzo, F.4
Chini, A.5
Mishra, U.K.6
|