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Applied Physics B: Lasers and Optics

Volumn 84, Issue 1-2, 2006, Pages 103-110

Interpretation of near-field images of semiconductor nanostructures

(2) Runge, E a Lienau, C b

a ILMENAU UNIVERSITY OF TECHNOLOGY (Germany)

b MAX BORN INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; PHOTOLUMINESCENCE; QUANTUM OPTICS; SEMICONDUCTOR MATERIALS; WAVE EQUATIONS;

BIEXCITON STATES; NEAR-FIELD IMAGES; SEMICONDUCTOR NANOSTRUCTURES; WAVE FUNCTION;

NANOSTRUCTURED MATERIALS;

EID: 33745726639 PISSN: 09462171 EISSN: None Source Type: Journal
DOI: 10.1007/s00340-006-2215-0 Document Type: Article

Times cited : (6)

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