Bleaching and micro-cracking phenomena induced in various types of sapphires by keV-electron beam irradiations

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 248, Issue 2, 2006, Pages 311-318

  Lee, Bo Hyun ^a   Teraji, Tokuyuki ^a   Ito, Toshimichi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Beam induced phenomenon; Bleaching; Cathodoluminescence; Cr3+ center; Electron beam; F+ center; Micro cracking; Sapphire

Indexed keywords

BLEACHING; CATHODOLUMINESCENCE; CRACK INITIATION; CRYSTALLIZATION; ELECTRON ENERGY LEVELS; ELECTRON IRRADIATION; IONS; SCANNING ELECTRON MICROSCOPY;

BEAM-INDUCED PHENOMENON; CR3+ CENTER; ELECTRON BEAM; F+CENTER; MICRO CRACKING;

SAPPHIRE;

BLEACHING; CRYSTALLIZATION; IONS;

EID: 33745658099     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.04.165     Document Type: Article

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