A study of synthetic sapphire by photoluminescence and X-ray diffraction

Microelectronics Journal

Volumn 34, Issue 2, 2003, Pages 95-97

  Kadlecikova M ^a   Breza, J ^a   Vesely M ^a   Cerven I ^a  

^a SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

Author keywords

Raman spectroscopy; Sapphire; X ray diffraction

Indexed keywords

ALUMINA; CRYSTALLOGRAPHY; PHOTOLUMINESCENCE; RAMAN SCATTERING; SAPPHIRE; X RAY DIFFRACTION;

SYNTHETIC SAPPHIRE;

MICROELECTRONICS;

EID: 0037301915     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(02)00173-8     Document Type: Article

References (9)

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