SCOPUS 정보 검색 플랫폼

Volumn 106, Issue 8-9, 2006, Pages 779-784

Dynamics of space and polarization charges of ferroelectric thin films measured by atomic force microscopy

Author keywords

Charge redistribution; Electrostatic force microscopy; Polarization; PZT

Indexed keywords

ATOMIC FORCE MICROSCOPY; LEAD COMPOUNDS; MICROSCOPIC EXAMINATION; POLARIZATION; SOL-GELS; SYNTHESIS (CHEMICAL);

CHARGE REDISTRIBUTION; ELECTROSTATIC FORCE MICROSCOPY (EFM); REVERSE-POLED REGIONS;

FERROELECTRIC THIN FILMS;

LEAD; PLATINUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD; ELECTRICITY; ELECTRODE; FILM; HYSTERESIS; POLARIZATION; SPACE; TEMPERATURE;

EID: 33745633575 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2005.12.015 Document Type: Article

Times cited : (8)

References (14)

1
- 35348846979
- Scott J.F., and de Araujo C.A.P. Science 246 (1989) 1400
- (1989) Science , vol.246 , pp. 1400
- Scott, J.F.¹ de Araujo, C.A.P.²

2
- 0003608424
- Saurenbach F., and Terris B.D. Appl. Phys. Lett. 56 (1990) 1703
- (1990) Appl. Phys. Lett. , vol.56 , pp. 1703
- Saurenbach, F.¹ Terris, B.D.²

3
- 0542395235
- Hong J.W., Koh K.H., Park S.I., Kwun S.I., and Khim Z.G. Phys. Rev. B 69 (1998) 5078
- (1998) Phys. Rev. B , vol.69 , pp. 5078
- Hong, J.W.¹ Koh, K.H.² Park, S.I.³ Kwun, S.I.⁴ Khim, Z.G.⁵

4
- 21544477058
- Lüthi R., Haefke H., Meyer K.-P., Meyer E., Howald L., and Güntherodt H.-J. J. Appl. Phys. 74 (1993) 7461
- (1993) J. Appl. Phys. , vol.74 , pp. 7461
- Lüthi, R.¹ Haefke, H.² Meyer, K.-P.³ Meyer, E.⁴ Howald, L.⁵ Güntherodt, H.-J.⁶

5
- 12944258605
- Hur J.H., Oh Y.J., Jo W., and Nam H.J. J. Korean Phys. Soc. 46 (2005) 341
- (2005) J. Korean Phys. Soc. , vol.46 , pp. 341
- Hur, J.H.¹ Oh, Y.J.² Jo, W.³ Nam, H.J.⁴

6
- 0000598015
- Hong J.W., Park S.I., and Khim Z.G. Rev. Sci. Instrum 70 (1999) 1735
- (1999) Rev. Sci. Instrum , vol.70 , pp. 1735
- Hong, J.W.¹ Park, S.I.² Khim, Z.G.³

7
- 27544499163
- Jo W. Ultramicroscopy 105 (2005) 299
- (2005) Ultramicroscopy , vol.105 , pp. 299
- Jo, W.¹

8
- 0031344718
- Gruverman A., Tokumoto H., Prakash A.S., Aggarwal S., Yang B., Wuttig M., Ramesh R., Auciello O., and Venkatesan T. Appl. Phys. Lett. 71 (1997) 3492
- (1997) Appl. Phys. Lett. , vol.71 , pp. 3492
- Gruverman, A.¹ Tokumoto, H.² Prakash, A.S.³ Aggarwal, S.⁴ Yang, B.⁵ Wuttig, M.⁶ Ramesh, R.⁷ Auciello, O.⁸ Venkatesan, T.⁹

9
- 0000996297
- Ganpule C.S., Nagarajan V., Ogale S.B., Roytburd A.L., Williams E.D., and Ramesh R. Appl. Phys. Lett. 77 (2000) 3275
- (2000) Appl. Phys. Lett. , vol.77 , pp. 3275
- Ganpule, C.S.¹ Nagarajan, V.² Ogale, S.B.³ Roytburd, A.L.⁴ Williams, E.D.⁵ Ramesh, R.⁶

10
- 0000144490
- Gruverman A., Auciello O., and Tokumoto H. Appl. Phys. Lett. 69 (1996) 3191
- (1996) Appl. Phys. Lett. , vol.69 , pp. 3191
- Gruverman, A.¹ Auciello, O.² Tokumoto, H.³

11
- 0000661220
- Ganpule C.S., Nagarajan V., Li H., Ogale A.S., Steinhauer D.E., Aggarwal S., Williams E., Ramesh R., and De Wolf P. Appl. Phys. Lett. 77 (2000) 292
- (2000) Appl. Phys. Lett. , vol.77 , pp. 292
- Ganpule, C.S.¹ Nagarajan, V.² Li, H.³ Ogale, A.S.⁴ Steinhauer, D.E.⁵ Aggarwal, S.⁶ Williams, E.⁷ Ramesh, R.⁸ De Wolf, P.⁹

12
- 0001569886
- Hong J.W., Jo W., Kim D.C., Nam H.J., Cho S.M., Lee H.M., and Bu J.U. Appl. Phys. Lett. 75 (1999) 3183
- (1999) Appl. Phys. Lett. , vol.75 , pp. 3183
- Hong, J.W.¹ Jo, W.² Kim, D.C.³ Nam, H.J.⁴ Cho, S.M.⁵ Lee, H.M.⁶ Bu, J.U.⁷

13
- 0000875743
- Jo W., Kim D.C., and Hong J.W. Appl. Phys. Lett. 76 (2000) 390
- (2000) Appl. Phys. Lett. , vol.76 , pp. 390
- Jo, W.¹ Kim, D.C.² Hong, J.W.³

14
- 0035971862
- Gruverman A., Kholkin A., Kingon A., and Tokumoto H. Appl. Phys. Lett. 78 (2001) 2751
- (2001) Appl. Phys. Lett. , vol.78 , pp. 2751
- Gruverman, A.¹ Kholkin, A.² Kingon, A.³ Tokumoto, H.⁴

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