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Volumn 315-316, Issue , 2006, Pages 762-765

AFM for preparing Si masters in soft lithography

Author keywords

AFM; PDMS; Soft lithography

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTOMERS; IMAGING TECHNIQUES; LITHOGRAPHY; MORPHOLOGY; SILICONES; SUBSTRATES;

EID: 33745620453     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-999-7.762     Document Type: Conference Paper
Times cited : (3)

References (11)
  • 6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.