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Volumn 315-316, Issue , 2006, Pages 762-765
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AFM for preparing Si masters in soft lithography
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Author keywords
AFM; PDMS; Soft lithography
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELASTOMERS;
IMAGING TECHNIQUES;
LITHOGRAPHY;
MORPHOLOGY;
SILICONES;
SUBSTRATES;
AFM;
PDMS;
POLYDIMETHYLSILOXANE (PDMS);
SOFT LITHOGRAPHY;
SILICON;
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EID: 33745620453
PISSN: 10139826
EISSN: 16629795
Source Type: Book Series
DOI: 10.4028/0-87849-999-7.762 Document Type: Conference Paper |
Times cited : (3)
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References (11)
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