Trends and trade-offs in designing highly robust throughput computing oriented chips and systems

Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005

Volumn 2005, Issue , 2005, Pages 74-77

  Parulkar, Ishwar ^a   Cypher, Robert ^a  

^a SUN MICROSYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP-SETS; COMPUTING ORIENTED CHIPS; DESIGN PARADIGMS; SILICON TECHNOLOGY;

INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; RELIABILITY; ROBUSTNESS (CONTROL SYSTEMS); SILICON;

MICROPROCESSOR CHIPS;

EID: 33745480179     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2005.68     Document Type: Conference Paper

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