The role of charge trapping at grain boundaries on charge transport in polycrystalline chemical vapor deposited diamond based detectors

Journal of Applied Physics

Volumn 99, Issue 11, 2006, Pages

  Hearne, S M ^a   Trajkov, E ^a   Jamieson, D N ^a   Butler, J E ^b   Prawer, S ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COLLECTION; CHARGE TRAPPING; DIAMOND BASED DETECTORS; THERMALLY STIMULATED CURRENT MEASUREMENTS;

CHARGE CARRIERS; CHEMICAL VAPOR DEPOSITION; DETECTORS; DIAMONDS; GRAIN BOUNDARIES; POLYCRYSTALLINE MATERIALS;

CHARGE TRANSFER;

EID: 33745313895     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2194116     Document Type: Article

References (27)

1. W. Adam, Nucl. Instrum. Methods Phys. Res. A 511, 124 (2003).
2. T. Behnke, P. Huntemeyer, A. Oh, J. Steuerer, A. Wagner, and W. Zeuner, Nucl. Instrum. Methods Phys. Res. A 414, 340 (1998).
3. S. P. Lansley, O. Gaudin, H. Ye, N. Rizvi, M. l D. Whitfield, R. D. McKeag, and R. B. Jackman, Diamond Relat. Mater. 11, 433 (2002).
4. E. Monroy, F. Omnes, and F. Calle, Semicond. Sci. Technol. 18, R33 (2003).
5. J. Isberg, Science (to be published).
6. J. H. Kaneko, Nucl. Instrum. Methods Phys. Res. A 505, 187 (2003).
7. H. Okushi, Diamond Relat. Mater. 10, 281 (2001).
8. S. M. Hearne, D. N. Jamieson, E. Trajkov, S. Prawer, and J. E. Butler, Appl. Phys. Lett. 84, 4493 (2004).
9. J. Hammersberg, J. Isberg, E. Johansson, T. Lundstrom, O. Hjortstam, and H. Bernhoff, Diamond Relat. Mater. 10, 574 (2001).
10. A. M. Zaitsev, in Handbook of Industrial Diamonds and Diamond Films, edited by, M. A. Prelas, G. Popovici, and, L. K. Bigelow, (Marcel Dekker, New York, 1998).
11. S. W. S. McKeever, in Thermoluminescence of Solids, edited by, R. W. Cahn, E. A. Davis, and, I. M. Ward, (Cambridge University Press, Cambridge, 1985).
12. P. Gonon, S. Prawer, Y. Boiko, and D. N. Jamieson, Appl. Phys. Lett. 70, 2996 (1997).
13. E. Borchi, M. Bruzzi, S. Pirollo, and S. Sciortino, Solid-State Electron. 42, 674 (1998).
14. E. Gheeraert, A. Deneuville, P. Gonon, M. Benabdesselam, and P. Iacconi, Phys. Status Solidi A 172, 183 (1999).
15. E. Trajkov, S. Prawer, and P. Spizzirri, Diamond Relat. Mater. 12, 1738 (2003).
16. E. Trajkov, Ph.D. thesis, University of Melbourne, 2004.
17. U. Zammit, K. N. Madhusoodanan, M. Marinelli, F. Mercuri, and S. Foglietta, Phys. Rev. B 57, 4518 (1998).
18. M. B. H. Breese, D. N. Jamieson, and P. J. C. King, Materials Analysis Using a Nuclear Microprobe (Wiley, New York, 1996).
19. D. N. Jamieson, Nucl. Instrum. Methods Phys. Res. B 136-138, 1 (1998).
20. C. Manfredotti, F. Fizzotti, A. Lo Giudice, P. Polesello, E. Vittone, R. Lu, and M. Jaksic, Diamond Relat. Mater. 8, 1597 (1999).
21. D. R. Beckman, A. Saint, P. Gonon, D. N. Jamieson, S. Prawer, and R. Kalish, Nucl. Instrum. Methods Phys. Res. B 158, 628 (1999).
22. P. J. Sellin, M. B. H. Breese, A. Galbiati, M. Maghrabi, and P. D. Townsend, Nucl. Instrum. Methods Phys. Res. A 487, 65 (2002).
23. F. Nava, C. Canali, C. Jacoboni, L. Reggiani, and S. F. Kozlov, Solid State Commun. 33, 475 (1980).
24. E. Vittone, F. Fizzotti, A. Lo Guidice, C. Paolini, and C. Manfredotti, Nucl. Instrum. Methods Phys. Res. B 161-163, 446 (2000).
25. C. E. Nebel, Semicond. Sci. Technol. 18, S1 (2003).
26. Technology Computer Aided Design (TCAD) software including (DESSIS) release 4.0, ISE Integrated Systems Engineering AG, Zurich; www.ise.com
27. S. M. Sze, Semiconductor Devices (Wiley, New York, 1985).