Form birefringence of oxidized porous silicon

Applied Physics Letters

Volumn 88, Issue 24, 2006, Pages

  Golovan, L A ^a   Ivanov, D A ^a   Melnikov, V A ^a   Timoshenko, V Yu ^a   Zheltikov, A M ^a   Kashkarov, P K ^a   Petrov, G I ^b   Yakovlev, V V ^b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE QUARTZ; IN-PLANE ANISOTROPY; OXIDIZED POROUS SILICON (OPS) FILMS; THIRD-HARMONIC SIGNAL GENERATION;

ANISOTROPY; BIREFRINGENCE; LIGHT POLARIZATION; NONLINEAR OPTICS; THIN FILMS; X RAY DIFFRACTION;

POROUS SILICON;

EID: 33745186689     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2212534     Document Type: Article

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