Sub-38 nm resolution tabletop microscopy with 13 nm wavelength laser light

Optics Letters

Volumn 31, Issue 9, 2006, Pages 1214-1216

  Vaschenko, G ^a   Brewer, C ^a   Brizuela, F ^a   Wang, Y ^a   Larotonda, M A ^a   Luther, B M ^a   Marconi, M C ^a   Rocca, J J ^a   Menoni, C S ^a   Anderson, E H ^b   Chao, W ^b   Harteneck, B D ^b   Liddle, J A ^b   Liu, Y ^b   Attwood, D T ^b  

^a Department of Civil and Environmental Engineering   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTREME-ULTRAVIOLET IMAGING; FRESNEL ZONE PLATE OPTICS; TABLETOP MICROSCOPY;

IMAGING TECHNIQUES; LASER BEAM EFFECTS; LASER OPTICS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER;

MICROSCOPIC EXAMINATION;

EID: 33745175234     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.31.001214     Document Type: Article

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