Resolution determination in X-ray microscopy: An analysis of the effects of partial coherence and illumination spectrum

Journal of X-Ray Science and Technology

Volumn 8, Issue 2, 1998, Pages 95-104

  Heck, John M ^a,b   Attwood, David T ^a,b   Meyer Ilse, Werner ^a   Anderson, Erik H ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; COHERENT LIGHT; COMPUTER SIMULATION; OPTICAL RESOLVING POWER; CHARGE COUPLED DEVICES; IMAGE ANALYSIS; LIGHTING; OPTICS; PARAMETER ESTIMATION; SPECTRUM ANALYSIS;

X RAY MICROSCOPY; ILLUMINATION SPECTRUM; SPECTRUM EFFECTS; ZONE PLATE;

X RAY MICROSCOPES;

EID: 0032312517     PISSN: 08953996     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

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