An analysis of microband orientation in a commercial purity aluminium alloy subjected to forward and reverse torsion using Electron Backscatter Diffraction (EBSD)

Journal of Microscopy

Volumn 222, Issue 2, 2006, Pages 97-104

  Lopez Pedrosa, M ^a   Wynne, B P ^a   Rainforth, W M ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Aluminium; Hot torsion; Microbands

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; STRAIN RATE; TENSILE STRAIN;

COMMERCIAL PURITY ALUMINUM; EFFECTS OF STRAINS; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; HIGH RESOLUTION ELECTRON BACKSCATTER DIFFRACTIONS; HOT TORSION; MICROBANDS; STRAIN PATHS; STRAIN REVERSAL; STRAIN-RATES;

TORSIONAL STRESS;

ALLOY; ALUMINUM;

ANALYTIC METHOD; ARTICLE; COMPARATIVE STUDY; DISSOLUTION; ELECTRON DIFFRACTION; METHODOLOGY; PRIORITY JOURNAL; STRESS STRAIN RELATIONSHIP; TEMPERATURE; TENSILE STRENGTH;

EID: 33745092054     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2006.01574.x     Document Type: Article

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