Elastic and surface energies: Two key parameters for CdSe quantum dot formation

Applied Physics Letters

Volumn 88, Issue 23, 2006, Pages

  Robin, Ivan Christophe ^a   Andrá, Rágis ^a   Bougerol, Catherine ^a   Aichele, Thomas ^a   Tatarenko, Serge ^a  

^a LIPHY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; HIGH ENERGY ELECTRON DIFFRACTION; INTERFACIAL ENERGY; MONOLAYERS; SEMICONDUCTING CADMIUM COMPOUNDS; THICKNESS CONTROL; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS SELENIUM; CRITICAL THICKNESS; ISLANDS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 33745037427     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2209202     Document Type: Article

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