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Volumn 352-354, Issue , 1996, Pages 99-104
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Stoichiometry determination of the Te-rich (100) CdTe and (100) ZnTe surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
EPITAXIAL GROWTH;
MODELS;
MONOLAYERS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SEMICONDUCTING CADMIUM COMPOUNDS;
SEMICONDUCTING ZINC COMPOUNDS;
STOICHIOMETRY;
SURFACES;
TELLURIUM;
ATOMIC LAYER EPITAXY;
SURFACE RECONSTRUCTION;
SURFACE STRUCTURE;
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EID: 0030147436
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(95)01103-X Document Type: Article |
Times cited : (23)
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References (10)
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