Photothermal scanning near-field microscopy

Materials Science and Engineering B

Volumn 24, Issue 1-3, 1994, Pages 226-228

  Stopka, M ^a   Oesterschulze, E ^a   Schulte, J ^a   Kassing, R ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; SUBSTRATES; THERMAL EFFECTS; THERMAL EXPANSION; THIN FILMS;

PHOTOTHERMAL MEASUREMENT; SCANNING NEAR FIELD MICROSCOPY; SCANNING THERMAL MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

PHOTOSENSITIVITY;

EID: 0028425636     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-5107(94)90333-6     Document Type: Article

References (6)

1. Photoacoustic, photothermal, and related techniques: a review
2. Nondestructive evaluation of solids and deposited films by thermal-wave interferometry
3. Photothermal modulation of the gap distance in scanning tunneling microscopy