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Volumn 2005, Issue , 2005, Pages 172-177

Experimental and modeling analysis on moisture induced failures in flip chip on flex interconnections with anisotropic conductive film

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE/ FLEX INTERFACE; ANISOTROPIC CONDUCTIVE FILMS (ACF); FLIP-CHIP-ON-FLEX INTERCONNECTIONS; MACRO-MICRO MODELING METHOD;

EID: 33744968651     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AGEC.2005.1452340     Document Type: Conference Paper
Times cited : (9)

References (15)
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  • 5
    • 0037301959 scopus 로고    scopus 로고
    • Effect of autoclave test on anisotropic conductive joints
    • C.W. Tan, Y.C. Chan and N. H. Yeung "Effect of Autoclave Test on Anisotropic Conductive Joints" Microelectronics Reliability 43(2003): 279-285
    • (2003) Microelectronics Reliability , vol.43 , pp. 279-285
    • Tan, C.W.1    Chan, Y.C.2    Yeung, N.H.3
  • 6
    • 84858900365 scopus 로고    scopus 로고
    • Anisotropic conductive film for flipchip applications: An introduction
    • Peter J. Opdahl "Anisotropic Conductive Film for Flipchip Applications: An Introduction", The Tutorial 05 on website: http://www.flipchips.com/tutorial05.html
    • The Tutorial 05 on Website
    • Opdahl, P.J.1
  • 9
    • 0037381421 scopus 로고    scopus 로고
    • The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications
    • C.Y.Yin, et al, "The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications" Microelectronics Reliability 43(2003): 625-633
    • (2003) Microelectronics Reliability , vol.43 , pp. 625-633
    • Yin, C.Y.1
  • 10
  • 11
    • 0035927989 scopus 로고    scopus 로고
    • Combined effects of humidity and thermal stress on the dielectric properties of epoxy-silica composites
    • P. Gonon, A. Sylvestre, J. Teysseyre and C. Prior, 2001, "Combined Effects of Humidity and Thermal Stress on the Dielectric Properties of Epoxy-silica Composites", Materials Science and Engineering B83, pp.158-164
    • (2001) Materials Science and Engineering , vol.B83 , pp. 158-164
    • Gonon, P.1    Sylvestre, A.2    Teysseyre, J.3    Prior, C.4
  • 12
    • 0032163066 scopus 로고    scopus 로고
    • Effect of postmold curing on plastic 1C package reliability
    • M. Ko and M. Kim, 1998, "Effect of Postmold Curing on Plastic 1C Package Reliability", Journal of Applied Polymer Science, 69 (11), pp.2187-2193
    • (1998) Journal of Applied Polymer Science , vol.69 , Issue.11 , pp. 2187-2193
    • Ko, M.1    Kim, M.2
  • 13
    • 84858892148 scopus 로고    scopus 로고
    • PHYSICA Multi-Physics Ltd, http://www.gre.ac.uk/~physica


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.