|
Volumn 132, Issue , 2006, Pages 365-368
|
Influence of crystal quality on electron mobility in AlGaN/GaN HEMTs grown on Si(111), SiC and GaN templates
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL STRUCTURE;
ELECTRIC PROPERTIES;
ELECTRON MOBILITY;
SAPPHIRE;
SILICON CARBIDE;
TRANSISTORS;
CRYSTAL QUALITY;
STRAIN STATE;
GALLIUM NITRIDE;
|
EID: 33744900336
PISSN: 11554339
EISSN: 17647177
Source Type: Conference Proceeding
DOI: 10.1051/jp4:2006132070 Document Type: Conference Paper |
Times cited : (8)
|
References (11)
|