Nondestructive detection of tilted surface defect with wedge shape by photoacoustic microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 5 B, 2006, Pages 4609-4611

  Endoh, Haruo ^a   Ohtaki, Naoki ^a   Hoshimiya, Tsutomu ^a  

^a TOHOKU GAKUIN UNIVERSITY   (Japan)

Author keywords

NDE; PA imaging; PAM; Photoacoustic microscope; Surface defect; Tilted surface defect; Wedge shape

Indexed keywords

DEFECTS; MICROSCOPIC EXAMINATION; PHOTOACOUSTIC EFFECT; SURFACE CHEMISTRY;

PA IMAGING; PHOTOACOUSTIC MICROSCOPE; SURFACE DEFECT; TILTED SURFACE DEFECT; WEDGE SHAPE;

NONDESTRUCTIVE EXAMINATION;

EID: 33744474056     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.4609     Document Type: Article

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