Observation of complicated surface defects by photoacoustic microscopy and nondestructive evaluation

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 5 SUPPL. B, 1997, Pages 3312-3317

  Endoh, Haruo ^a   Hiwatashi, Yoichiro ^a   Hoshimiya, Tsutomu ^a  

^a TOHOKU GAKUIN UNIVERSITY   (Japan)

Author keywords

Imaging; NDE; PAM; Photoacoustic microscopy; Surface defect

Indexed keywords

PHOTOACOUSTIC MICROSCOPY (PAM); SURFACE DEFECTS;

ACOUSTIC MICROSCOPES; DEFECTS; ELECTRIC DISCHARGES; IMAGE RECONSTRUCTION; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; NONDESTRUCTIVE EXAMINATION; PHOTOACOUSTIC EFFECT;

SURFACE PROPERTIES;

EID: 0031147054     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.3312     Document Type: Review

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