Observation of surface defects using photoacoustic microscope and quantitative evaluation of the defect depth

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 5 SUPPL. B, 1996, Pages 2916-2920

  Hoshimiya, Tsutomu ^a   Endoh, Haruo ^a   Hiwatashi, Yoichiro ^a  

^a TOHOKU GAKUIN UNIVERSITY   (Japan)

Author keywords

Imaging; NDT; PAM; Photoacoustic microscopy; QNDE; Surface defect

Indexed keywords

ELECTRIC DISCHARGES; EVALUATION; EXPERIMENTS; IMAGING TECHNIQUES; NONDESTRUCTIVE EXAMINATION; NUMERICAL ANALYSIS; SURFACE PROPERTIES;

DEFECT DEPTH; EXPERIMENTAL APPARATUS; PHOTOACOUSTIC MICROSCOPY; SURFACE DEFECT;

PHOTOACOUSTIC EFFECT;

EID: 0030142813     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.2916     Document Type: Article

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