Observation and nondestructive evaluation of tilting surface defects by photoacoustic microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 5 B, 2004, Pages 2940-2941

  Endoh, Haruo ^a   Inomata, Keita ^a   Miyamoto, Katsuhiko ^a   Hiwatashi, Yoichiro ^a   Hoshimiya, Tsutomu ^a  

^a TOHOKU GAKUIN UNIVERSITY   (Japan)

Author keywords

NDT; PA cell; PA imaging; Photoacoustic microscope (PAM); Surface defect; Tilting surface defect

Indexed keywords

CRACK PROPAGATION; DEFECTS; FREQUENCY MODULATION; LASER BEAMS; MICROSCOPIC EXAMINATION; NONDESTRUCTIVE EXAMINATION; SCANNING;

PA CELL; PA IMAGING; PHOTOACOUSTIC MICROSCOPE (PAM); SURFACE DEFECTS; TILTING SURFACE DEFECT;

PHOTOACOUSTIC EFFECT;

EID: 3242775394     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.2940     Document Type: Conference Paper

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