New magnetic flash memory with FePt magnetic floating gate

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 4 B, 2006, Pages 3217-3221

  Yin, Cheng Kuan ^a   Bea, Ji Chel ^b   Hong, Youn Gi ^b   Fukushima, Takafumi ^a   Miyao, Masanobu ^c   Natori, Kenji ^d   Koyanagi, Mitsumasa ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c KYUSHU UNIVERSITY   (Japan)

^d UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

FePt; Floating gate; Nonvolatile memory; Rapid thermal annealing

Indexed keywords

COERCIVE FORCE; IRON ALLOYS; MAGNETRON SPUTTERING; MOS DEVICES; RAPID THERMAL ANNEALING; THIN FILMS;

FEPT; FLOATING GATE; MAGNETIC TUNNELING DIODE (MTD); NONVOLATILE MEMORY;

FLASH MEMORY;

EID: 33646941907     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.3217     Document Type: Article

References (12)

1. M. Takada, S. Kondoh, T. Sakaguchi, H. Choi, J.-C. Shim, H. Kurino and M. Koyanagi: IEDM Tech. Dig., 2003, p. 553.
2. T. Sakaguchi, Y. G. Hong, M. Kobayashi, H. Choi, J. C. Shim, H. Kurino and M. Koyanagi: Jpn. J. Appl. Phys. 43 (2004) 2203.
3. P. T. L. Minh, N. P. Thuy and N. T. N. Chan: J. Magn. Magn. Mater. 277 (2004) 187.
4. T. Shima, K. Takanashi, Y. K. Takahashi, K. Hono, G. Q. Li and S. Ishio: J. Magn. Magn. Mater. 266 (2003) 171.
5. S. Sun, C. B. Muray, D. Weller, L. Folks and A. Moser: Science 287 (2000) 1989.
6. D. Weller, A. Moser, L. Folks, M. E. Best, W. Lee, M. F. Toney. M. Schwickert, J.-U. Thiele and M. F. Doerner: IEEE Trans. Magn. 36 (2000) 10.
7. H. Zeng, J. Li, J. P. Liu, Z. L. Wang and S. H. Sun; Nature (London) 420 (2002) 395.
8. S. H. Sun, E. E. Fullerton, D. Weller and C. B. Murray: IEEE Trans. Magn. 37 (2001) 1239.
9. C. H. Tsang, R. E. Fontana, Jr., T. Lin, D. E. Heim, B. A. Gurney and M. L. Williams: IBM J. Res. Dev. 42 (1998) 103.
10. W. P. Jayasekara, J. Grant, J. A. Bain, A. E. T. Kuiper and M. H. Kryder: IEEE Trans. Magn. 33 (1997) 2830.
11. H. Takano, H. Fukuoka, M. Suzuki, K. Shiiki and M. Kitadu: IEEE Trans. Magn. 27(1991)4678.
12. N. Fukushima, H. Katai, T. Wada and Y. Horiike: Jpn. J. Appl. Phys. 35 (1996) 2512.